JSM -6610 LV SEM
JSM-6610 LV SEM
JSM -6610 LV SEM is a high performance scanning electron microscope for fast characterization and imaging of fine structures. It has a medium-size chamber and stage, multiple ports, and has additional analytical attachments including a heating/cooling substage and EDS system. This SEM can handle a wide variety of sample sizes and shapes providing the versatility of dealing with samples that are wet, oily, out-gas excessively or are non-conductive without pre-treatment.
Accelerating Voltage: Ranges from 300 V to 30kV
- Magnification: Ranges from 5X to 400,000X
- Resolution: 3.0nm at 30kV
- Imaging Modes:
- High vacuum: SE (secondary electron)
- BSE (backscatter electron)
- Low vacuum (Variable pressure)
- Field of View: Up to 25.4mm
Energy Dispersive Spectrometer (EDS)
The JEM 6610LV Scanning Electron Microscope (SEM) is equipped with EDS. SEM/EDS provides
chemical analysis of the field of view or spot analyses of minute particles.
The EDS Analysis System for SEM was designed for a wide range of applications. Whether simply collecting a spectrum or performing complex phase analysis, the system is easy to get the quick results you want.
EDS analysis is best suited for:
- Metals and metal alloys
- Certain types of polymeric materials.