JEOL JXA-8230 Electron Microprobe

photoJEOL JXA-8230

The Electron Microprobe Laboratory is equipped with the fully-automated JEOL JXA-8230 high resolution, highly stable SEM and a WDS/EDS combined Electron Probe Microanalyzer (EPMA). The microprobe has a total of 3 wavelength-dispersive spectrometers (each spectrometer holds 2 of the following crystals: TAPJ, PETJ, PETHS, LDE2 LIF, LIFHS) The primary function of the microprobe is to provide major- and minor-element analyses of solid samples at the 1-5 micron scale and it can acquire digital secondary-electron and backscattered-electron images as well as elemental x-ray maps making it possible to analyze solid materials in situ and to resolve complex chemical variation (e.g. zoning) within single phases.

Wavelength Dispersive Spectroscopy, WDS
Energy Dispersive Spectroscopy, EDS
Secondary Electron Imaging, SEI
Backscatter Electron Imaging, BSE
Quantitative Analysis
Elemental Mapping (EDS; WDS)
Phase Analysis
Line Analysis

EPMA has a broad range of scientific applications and is used in a variety of fields including geology, biology, archeology, material science, chemical, mechanical and biomedical engineering, physical and biological chemistry, solid-state physics, metallurgy, and electronics.