JEOL JXA-8230 Electron Microprobe
The Electron Microprobe Laboratory is equipped with the fully-automated JEOL JXA-8230 high resolution, highly stable SEM and a WDS/EDS combined Electron Probe Microanalyzer (EPMA). The microprobe has a total of 3 wavelength-dispersive spectrometers (each spectrometer holds 2 of the following crystals: TAPJ, PETJ, PETHS, LDE2 LIF, LIFHS) The primary function of the microprobe is to provide major- and minor-element analyses of solid samples at the 1-5 micron scale and it can acquire digital secondary-electron and backscattered-electron images as well as elemental x-ray maps making it possible to analyze solid materials in situ and to resolve complex chemical variation (e.g. zoning) within single phases.
- Wavelength Dispersive Spectroscopy, WDS
- Energy Dispersive Spectroscopy, EDS
- Secondary Electron Imaging, SEI
- Backscatter Electron Imaging, BSE
- Quantitative Analysis
- Elemental Mapping (EDS; WDS)
- Phase Analysis
- Line Analysis
EPMA has a broad range of scientific applications and is used in a variety of fields including geology, biology, archeology, material science, chemical, mechanical and biomedical engineering, physical and biological chemistry, solid-state physics, metallurgy, and electronics.