Mail-in Thin Film Measurement Request Form
If you are too far away to become an on-site NFF user we offer mail-in thin film characterization services using our Woollam RC2 Ellipsometer. We are able to provide both thickness measurements as well as dielectric constants for a wide range of thin film materials. Measurement cost are $100/sample and plus $40/hr for data analysis. Please use the form below to contact us regarding your specific samples.