Mail-in Thin Film Measurement Request Form

 If you are too far away to become an on-site NFF user we offer mail-in thin film characterization services using our Woollam RC2 Ellipsometer.  We are able to provide both thickness measurements as well as dielectric constants for a wide range of thin film materials. Measurement cost are $100/sample and plus $40/hr for data analysis. Please use the form below to contact us regarding your specific samples.

I authorize that all information provided on this feedback form, including any and all personal data will be shared with the NFF. The data will be retained for an indefinite period of time.

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