Mail-in Thin Film Measurement Request Form

 If you are too far away to become an on-site NFF user we offer mail-in thin film characterization services using our Woollam RC2 Ellipsometer.  We are able to provide both thickness measurements as well as dielectric constants for a wide range of thin film materials. Measurement cost are $100/sample and plus $40/hr for data analysis. Please use the form below to contact us regarding your specific samples.

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*Name

*Department/Affiliation

*Email Address

*Contact Number

*Sample Description

*Measurement Specifications

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*Data Consent

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