Atomic Force Microscope (AFM)

Horiba SmartSPM AIST

Horiba
The SmartSPM Scanning Probe Microscope is a fully automated system that offers ultra-fast and high-resolution measurements for the most advanced materials research at the nano scale in all AFM modes
Key Features:
  • High speed 100µm scanner
  • 1300nm AFM laser
  • Lowest noise closed loop sensors

Operating Modes:

  • Contact and Non-contact AFM mode in air/liquid
  • Conductive AFM
  • Kelvin Probe (Surface Potential Microscopy)
  • Nanolithography

Graphene Oxide

Graphene Oxide on gold coated substrate

Nano Spirals

Nano spirals, Tiago Ramos Leite da Silva, ChE LSU

Carbon NanowiresCarbon Nanowires on gold substrate

Top Image: Topography Scan
Bottom Image: Conductive AFM Scan

Veeco Dimension 3100

Veeco Dimension 3100

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Samples can be handled by the instrument range from small pieces to 150 mm diameter wafers.

Modes: Contact and Tapping mode

AFM
Pristine poly(styrene-block-methyl methacrylate) film by Qi Lei, ChE LSU

AFM
Template stripped Silver film by Tiago Ramos Leite da Silva, ChE LSU